Quickly extracting fidelity decay rates in random circuit benchmarking experiments

Source: arxiv.org/abs/2610.11540

Ake Köhne, Stavros Efthymiou, Joanna Majsak, Jadwiga Wilkens, Bram Evert, Andrew D. Patterson, Jonas Helsen, Markus Heinrich, Ingo Roth

arXivarxiv/2610.11540Oct 8, 2026quant-phscore 0

Randomized benchmarking (RB) with structured circuits is experimentally scalable, but gives biased short-depth fidelity estimates because incomplete ensemble mixing introduces transient modes. Waiting for these transients to decay in deeper circuits can push the signal below the noise floor. This is a well-established obstacle, e.g. in linear cross-entropy benchmarking (LinXEB). Here we overcome this obstacle solely through classical post-processing. We introduce a one-parameter family of estimators that interpolate between the standard LinXEB-type post-processing and a new post-processing…

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